The Central Research Facility at IIT Delhi is established for the purpose of enhancing the research ability of researchers by providing expensive analytical instruments as shared facility and for providing support for carrying out specialized analysis of samples of various kinds. Our aim is to facilitate research and technology development in the area of advanced materials, and thus, offer state-of-the-art characterization facilities. Proper and reliable characterization is an important aspect in any research work. Three instruments from SMITA Research Lab are being offered under CRF. These are Field Emission Scanning Electron Microscope (FE SEM), Micro Raman, and Nuclear Magnetic Resonance (NMR) Spectrometer.Field Emission Scanning Electron Microscope (FESEM) with Oxford-EDX system IE 250 X Max 80
Name of Instrument: Field Emission Scanning Electron Microscope
Model: FEI Quanta 200 F SEM
Company Name: FEI Company (Netherland)
The Quanta 200 FEG Scanning Electron Microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with high-energy beam of electrons in a raster scan pattern enabling the investigation of conductive, non-conductive and high-vacuum incompatible materials. It offers nanometer resolution and a high signal to noise ratio in both regular high vacuum and environmental modes. The EDS consists latest 80 mm2 SDD detector enables detection of elements under high resolution.
Capability: • Three modes of operation can be studied in The Quanta 200 FEG SEM i.e. High vacuum (with coating mode), Low Vacuum (without coating mode), Environmental SEM and Scanning Transmission electron Microscopy.
• Quanta FEG 200 comprises of different types like ETD (Everhart-Thornley detector), Backscattered Electrons Detector (BSED), Large Field Detector (LFD), and Gaseous Secondary Electron Detector (GSED).
• STEM (Scanning Transmission Electron Microscopy) is also possible to form atomic resolution images and high contrast imaging of biological samples. • Surface morphology of all kinds of conductive and non conductive samples can be analyzed.
• Texture information by performing phase identification and orientation mapping can be done by EDS.
Because SEM utilizes vacuum conditions and uses electron beam to form an image, special sample preparations is needed as listed below:-
• The sample is mounted on carbon tape that is put on the surface of the stub.
• Approximate size of the sample 1 x 1 cm (max).
• All water must be removed from the samples because the water would vaporize in the vacuum.
• Electrically conductive samples do not require any preparation before being used, however the samples must be completely dry and free from volatile substances.
• Non-conductive samples need to be made conductive by coating the sample (using sputter coater) with a thin layer of conductive material like Au/Ag/C. • For STEM mode, sample needs to be prepared on TEM grid.
• In case of liquid sample, put a small drop of sample on TEM grid and dry it.
• For solid sample, small amount is put on TEM grid.
User Type FESEM (Per Sample) FESEM -EDX (Per Sample) IITD Users Rs 275.00 Rs 350.00 Outsider Student Rs. 1250.00 Rs. 1800.00 Industries Rs. 3000.00 Rs. 5000.00
You can pay amount online using following details:
Beneficiary/Customer's Name: IRD ACCOUNT IITD
Bank Account Number: 10773572600
Bank Name: State Bank of India
Branch Name: IIT Branch
Branch Code: 01077
NEFT IFSC CODE / RTGS: SBIN0001077
please write "CRF FE-SEM EDs CF IITD" in the Remarks section while paying. Save the receipt file and send it to us at email@example.com. along with request.
Payment can also made in form Demad Draft in favour of " IRD ACCOUNT IITD " Payable at New Delhi.
Ex- Hall Room No. MS 108 TEM Lab,
Behind CCD Main Building
Indian Institute of Technology
Hauz Khas, New Delhi-110016, India
Prof. Ashwini K Agrawal
Prof. Manjeet Jassal
1. Ms.Kumud Arora - Operational Incharge
Phone Numbers and E-mail Address
011-26596520 , firstname.lastname@example.org