CRF Intranet

HR-TEM 200 K​eV ( CRF Co-Owned Facility Sonipat Campus)

The transmission electron microscope is a strong instrument for obtaining morphologic, chemical, and crystallographic information from materials. A high energy electron beam in kV is shone through a very thin material, and the interactions between the electrons and atoms may be utilized to study properties like as crystal structure, dislocations, and grain boundaries etc. The TEM facility at IIT Delhi Sonipat Campus has 80 kV and 200 kV TEMs that are suited for high contrast imaging in materials science applications. The JEM-ARM200F NEOARM is equipped with a Cold FEG Tungsten filaments emitter and provides the world's highest STEM resolution. By combining a CFEG with a STEM Cs corrector, an incredibly tiny electron probe may be formed on a specimen. This incredibly tiny electron probe enables STEM imaging, as well as STEM-EDS (GATAN STEM PACK 777.U1) and EELS (GATAN EELS MODEL 977) analysis at the sub-angstrom level. The JEM-ARM200F captures STEM pictures in both bright and dark fields. The DF STEM detector can see and acquire four pictures at the same time: a wide angle dark field STEM image, a low angle dark field STEM image, a bright field image, and a backscattered electron image. The equipment can also do tomography measurements. The instrument can obtain a TEM resolution of 0.23nm, 0.10nm and 0.11nm for point, lattice and information limit respectively along with 0.10nm BF/DF lattice image STEM resolution, all with Cs corrector.

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

Instrument Specification:
A.    Electron Gun:
  1. High tension at 80 kV and 200 kV  
  2. W Cold field emitter (CFEG) Imaging 
  3. High tilt and large field of view (double-tilt holder) 
  4. Motor driven axis alignment in horizontal direction provided. 
  5. Shift and tilt, coupled two stage electromagnetic deflector  
  6. 7 Stage accelerating tube
B.    Condenser Lenses
  1. 3 stage Condenser Lenses 
  2. Motor driven eight Pt disc aperture holes 
  3. Electromagnetic with centering stigmator 
  4. Independent electromagnetic deflector for TEM and Probe mode
C.    STEM Cs Corrector
  1. Two stage transfer double lenses + Two stage Hexapole Cs correction method 
  2. Online analysis by analyzing and de-convolution probe shape tableau analyzing aberration and segmented ronchigram auto-correlation function matrix (SRAM) method.
D.    EDS (30mm2/50mm2) when using the tilting holder
  1. Solid Angle = 0.13sr/0.24sr 
  2. Take off Angle = 25°/22.3° and EDS (100mm2) is option.
E.    Specimen Chamber
    1. Standard Configuration specimen size - 3mm dia grid, Loadable specimen number - 1 
    2. Intelligent type piezeo device/power supply standard configuration goniometer
F.    Viewing and Detection chamber
  1. 3 stage Condenser Lenses 
  2. Motor driven eight Pt disc aperture holes 
  3. Electromagnetic with centering stigmator 
  4. Independent electromagnetic deflector for TEM and Probe mode
Required Samples for HRTEM
CRF Testing Charges
HOW TO CONTACT
Mailing Address for Samples & Lab Location

Lab No. 4, CRF IIT Delhi, Sonipat Campus Rajiv Gandhi Education City Rai Industrial Area, 
Sonipat-131029, 
Haryana. 

Coordinator 

Prof. Ashwani Agarwal, 
Room no.: TX 206, 
Department of Textile and Fibre Engineering, IIT Delhi
New Delhi 110016
Tel:  +91-11-26591415; 65105930 
Fax: +91-11-26526154   
E-mail: ashwini@smita-iitd.com

Coordinator 

Prof. Nirat Ray 
Room no. 203 A, 
Department of Materials Science and Engineering, Indian Institute of Technology, Hauz Khas New Delhi-110016, India
Tel: 011-26597974 
E-mail: nirat@mse.iitd.ac.in

Operational Incharge:

Dr. Rajinder Kumar
Sr. Project Scientist
Lab No. 4, CRF IIT Delhi, Sonipat Campus Rajiv Gandhi Education City Rai Industrial Area, 
Sonipat-131029, Haryana.  
Email: ird13731@iitd.ac.in

Get CRF Registration for 
External users 

1. Registration process (One Time): New Registration for external users.User Verification: Upload photo of Front side and back side of valid Identity card issued by the organization (only .jpeg format, file Size less than 1 Mb, height less than 1000 pixels, width less than 800 pixels). Undertaking: Download the undertaking template ( Download Link ). Duly filled, signed and stamped form should be uploaded in .pdf format. Confirmation: An email will be sent to the user after verification of the documents.

2.Before planning to avail the Instrument facility of CRF IIT Delhi: user must visit https://crf.iitd.ac.in -> Facility -> select the desired facility from left side navigation list.  Read carefully all the relevant information such as required sample type, testing charges and instrument location. Be prepared with details of the samples.

3.Log in and Click on Booking Appointment Tab: All the information relevant to testing must be filled in instrument booking form. In case user does not provide the required information the booking is liable to be rejected. User can upload the relevant existing data of their samples that might help in the measurements.

4.Sample submission & Payment Process: Once the application is submitted, the in-charge will verify the details and approve the request.External users must wait for the approval before making the payment and submitting the samples to concerned lab. After approval the payment should be made by the user. The payment transaction details need to be submitted online before appointment date time.

5.CRF Users can pay amount online using following details:
Beneficiary/Customer's Name: IRD ACCOUNT IITD
Bank Account Number:  10773572600  
Bank Name: State Bank of India Branch Name: IIT Branch
Branch Code: 01077
NEFT IFSC CODE / RTGS: SBIN0001077
please write "CRF _Instrument Name" in the Remarks section while paying. Save the receipt file and upload in the crfbooking system online against your application.Payment can also made in form of demand draft in favour of " IRD ACCOUNT IITD " Payable at New Delhi.6.IIT Delhi 
GST Number : 07AAATI0393L1ZI
PAN Number : AAATI0393L

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