CRF Intranet

Spectroscopic Ellipsometry System (MBE Lab Sonipat Campus)

Ellipsometry is an indirect sensitive, non-destructive and non-contact, optical method to determine the complex refractive index and thickness of bulk materials and thin film structures. The method is based on the polarization state change of polarized electromagnetic radiation interacting (reflected or transmitted) through material surfaces. Light reflected from the surface or interface of a sample leads to change in the polarization state with respect to the incident beam. This change is a characteristic of the reflecting surface as well as the structure and material of the investigated sample. Ellipsometry detects and interprets the changes in the state of polarization of light upon reflection from (or in special cases, transmission through) thin layer surfaces or interfaces. The measured data are traditionally expressed as two ellipsometric angles Ψ and Δ which describe the changes in the relative amplitude ratio and phase difference of the parallel and perpendicular components of the electronic field vector of the light wave (with respect to the plane of the incidence). These two ellipsometric parameters contain the information related to the optical properties of the sample. In case of spectroscopic ellipsometry Ψ and Δ are measured as a function of wavelength (or photon energy). The next workflow of the evaluation is the determination of the theoretical ellipsometric parameter Ψ and Δ from the model. The comparison between the calculated (modeled) and measured results is done through a fitting procedure. By fitting procedure, we extract the physical quantities like refractive index, thickness, composition, crystal structure and bandgap.

Specification of Spectroscopic Ellipsometry
  1. Make of Ellipsometry: Semilab, France
  2. Xenon source with wavelength range: 200 nm to 1200 nm.
  3. Fixed Angle of Incidence: 70 Degree
  4. Analysis Software: Semilab’s SEA Spectroscopic Ellipsometry Analysis software
  5. Measurments : Monolayer to bulk film thickness, Refractive Index, Isotherms, Porosity and Young modulus
Samples Requirment :  Thin Film: Thin film in respect of any substrate.
Testing Charges (Click here)

How to contact

Lab-Physical Location: 

MBE Lab # 16, 
Central Research Facilities (CRF)  IIT Delhi Sonipat Campus, Rajiv Gandhi Education City,  Rai Industrial Area Rai, Sonipat – 131029 Haryana 
Landmark: Near Ashoka University

Lab Coordinator

Prof. Rajendra Singh
Physics Department,
IIT Delhi  Hauz Khas New Delhi 110016

Operational In-charge

Mr. Santanu Kandar, 
IEmail: ​phz208786@iitd.ac.in

Get CRF Registration for 
External users 

1. Registration process (One Time): New Registration for external users.User Verification: Upload photo of Front side and back side of valid Identity card issued by the organization (only .jpeg format, file Size less than 1 Mb, height less than 1000 pixels, width less than 800 pixels). Undertaking: Download the undertaking template ( Download Link ). Duly filled, signed and stamped form should be uploaded in .pdf format. Confirmation: An email will be sent to the user after verification of the documents.

2.Before planning to avail the Instrument facility of CRF IIT Delhi: user must visit https://crf.iitd.ac.in -> Facility -> select the desired facility from left side navigation list.  Read carefully all the relevant information such as required sample type, testing charges and instrument location. Be prepared with details of the samples.

3.Log in and Click on Booking Appointment Tab: All the information relevant to testing must be filled in instrument booking form. In case user does not provide the required information the booking is liable to be rejected. User can upload the relevant existing data of their samples that might help in the measurements.

4.Sample submission & Payment Process: Once the application is submitted, the in-charge will verify the details and approve the request.External users must wait for the approval before making the payment and submitting the samples to concerned lab. After approval the payment should be made by the user. The payment transaction details need to be submitted online before appointment date time.

5.CRF Users can pay amount online using following details:
Beneficiary/Customer's Name: IRD ACCOUNT IITD
Bank Account Number:  10773572600  
Bank Name: State Bank of India Branch Name: IIT Branch
Branch Code: 01077
NEFT IFSC CODE / RTGS: SBIN0001077
please write "CRF _Instrument Name" in the Remarks section while paying. Save the receipt file and upload in the crfbooking system online against your application.Payment can also made in form of demand draft in favour of " IRD ACCOUNT IITD " Payable at New Delhi.6.IIT Delhi 
GST Number : 07AAATI0393L1ZI
PAN Number : AAATI0393L

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