The Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is an ultra-high resolution mass spectrometry which is used for the chemical characterization with high accuracy of solid surfaces from any scientific field of medical science, biology, material science, physics, chemistry, etc.. In this technique, the sample is rastered with a focused beam of primary ions and the secondary ions knocked out of the material are analyzed. These secondary ions are then accelerated into a "flight tube" and their mass is determined by measuring the exact time at which they reach the detector (i.e. time-of-flight). Flight time analyzer of TOF-SIMS measure a complete mass spectrum per sputter pulse.
TOF-SIMS is a static SIMS method in which only the top atomic layers are stimulated to provide surface sensitive information. An additional sputter source (Gas Cluster Ion Beam-GCIB; Cs or Oxygen) is also used for the measurement of depth profiles. Depth profiling can be used for measurement of distribution of elements on the surfaces, as well as the visualization of lateral and depth distributions over the layers in 2D/3D images of the surfaces of inorganic/organic materials. ToF-SIMS can be used on conducting, semi-conducting or insulating surfaces. As detection limit of ToF-SIMS is in the ppm range, small amounts of substances can be sensitively detected.
Transport of Samples
1. It is must to submit the dry non - degassing samples at least one working day before the measurement (booking) day to keep the samples in the vacuum, failing which measurement will not be possible.
2. The users are advised to submit samples of similar surface chemistry so that more samples could be measured in a single slot. Users can submit in the one day slot upto-
(a) 4- samples for the depth profiling upto 500 nm depth/ or
(b) 2- samples for the depth profiling for a depth more than 500 nm/ or
(c) 6-samples for the mass spectroscopy. If time permits, more samples could be accommodated for the measurements.
Depth profiles will be done in one polarity -either positive/ or negative, as per the requirement of the users.
3. For identification of the front surface- to be analysed, it is essential to mark (one may write- B) on the back surface of the sample.
4. Users are required to provide the list of ions (with their chemical formula) to study of each sample before measurement. The list may be submitted along with the samples. In case of depth profile of layered structure of a sample, provide all details- the thickness & elements (Chemical Formula) of each layer, total thickness to be probed and the polarity required for the measurement.
1. Registration process (One Time): New Registration for external users.User Verification: Upload photo of Front side and back side of valid Identity card issued by the organization (only .jpeg format, file Size less than 1 Mb, height less than 1000 pixels, width less than 800 pixels). Undertaking: Download the undertaking template ( Download Link ). Duly filled, signed and stamped form should be uploaded in .pdf format. Confirmation: An email will be sent to the user after verification of the documents.
2.Before planning to avail the Instrument facility of CRF IIT Delhi: user must visit https://crf.iitd.ac.in -> Facility -> select the desired facility from left side navigation list. Read carefully all the relevant information such as required sample type, testing charges and instrument location. Be prepared with details of the samples.
3.Log in and Click on Booking Appointment Tab: All the information relevant to testing must be filled in instrument booking form. In case user does not provide the required information the booking is liable to be rejected. User can upload the relevant existing data of their samples that might help in the measurements.
4.Sample submission & Payment Process: Once the application is submitted, the in-charge will verify the details and approve the request.External users must wait for the approval before making the payment and submitting the samples to concerned lab. After approval the payment should be made by the user. The payment transaction details need to be submitted online before appointment date time.
5.CRF Users can pay amount online using following details:
Beneficiary/Customer's Name: IRD ACCOUNT IITD
Bank Account Number: 10773572600
Bank Name: State Bank of India Branch Name: IIT Branch
Branch Code: 01077
NEFT IFSC CODE / RTGS: SBIN0001077
please write "CRF _Instrument Name" in the Remarks section while paying. Save the receipt file and upload in the crfbooking system online against your application.Payment can also made in form of demand draft in favour of " IRD ACCOUNT IITD " Payable at New Delhi.6.IIT Delhi
GST Number : 07AAATI0393L1ZI
PAN Number : AAATI0393L
1 Registration process (One Time): New Registration for internal users.
Fill in all the details in Personal Information, Supervisor Information and User Login Credentionals.
Once submitted, an email to supervisor is sent for activation of account. Once activated by supervisor, you can do the instrument bookings.
2 Before planning to avail the Instrument facility of CRF IIT Delhi: user must visit https://crf.iitd.ac.in > Facilities > select the desired facility from left side navigation list. Read ca 
refully all the relevant information such as required sample type, testing charges and instrument location. Be prepared with details of the samples.
3. Log in on CRF Booking System and Click on Booking Appointment Tab: All the information relevant to testing must be filled in instrument booking form. In case user does not provide the required information the booking is liable to be rejected. User can upload the relevant existing data of their samples that might help in the measurements.
4 Sample submission & Payment Process: Once the application is submitted, the in-charge will verify the details and approve the request.
